发明名称 |
Power supply control device, plasma processing device, and plasma processing method |
摘要 |
According to one embodiment, a power supply control device of a plasma processing device having a plasma generation unit which generates plasma in a process chamber. The power supply control device includes a radio frequency power supply, a storage unit, and a matching circuit. The radio frequency power supply supplies a power to the plasma generation unit. The storage unit stores matching information including a first matching value, a second process condition, and a third matching value. The first matching value corresponds to process information of a first process condition. The second matching value corresponds to process information of a second process condition. The third matching value corresponds to process information of a transient state where the first process condition is being switched to the second process condition. The matching circuit matches impedances based on the matching information. |
申请公布号 |
US8760053(B2) |
申请公布日期 |
2014.06.24 |
申请号 |
US201113198356 |
申请日期 |
2011.08.04 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Eto Hideo;Nishiyama Nobuyasu;Saito Makoto;Suzuki Keiji |
分类号 |
H05B31/26;H03H7/38 |
主分类号 |
H05B31/26 |
代理机构 |
Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P. |
代理人 |
Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P. |
主权项 |
1. A power supply control device of a plasma processing device having a plasma generation unit which generates plasma in a process chamber, the power supply control device comprising:
a radio frequency power supply which supplies a power to the plasma generation unit; a storage unit which stores matching information including a first matching value, a second matching value, and a third matching value, the first matching value corresponding to process information of a first process condition, the second matching value corresponding to process information of a second process condition, and the third matching value corresponding to process information of a transient state where the first process condition is being switched to the second process condition; and a matching circuit which matches impedances based on the matching information.
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地址 |
Tokyo JP |