发明名称 Power supply control device, plasma processing device, and plasma processing method
摘要 According to one embodiment, a power supply control device of a plasma processing device having a plasma generation unit which generates plasma in a process chamber. The power supply control device includes a radio frequency power supply, a storage unit, and a matching circuit. The radio frequency power supply supplies a power to the plasma generation unit. The storage unit stores matching information including a first matching value, a second process condition, and a third matching value. The first matching value corresponds to process information of a first process condition. The second matching value corresponds to process information of a second process condition. The third matching value corresponds to process information of a transient state where the first process condition is being switched to the second process condition. The matching circuit matches impedances based on the matching information.
申请公布号 US8760053(B2) 申请公布日期 2014.06.24
申请号 US201113198356 申请日期 2011.08.04
申请人 Kabushiki Kaisha Toshiba 发明人 Eto Hideo;Nishiyama Nobuyasu;Saito Makoto;Suzuki Keiji
分类号 H05B31/26;H03H7/38 主分类号 H05B31/26
代理机构 Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P. 代理人 Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
主权项 1. A power supply control device of a plasma processing device having a plasma generation unit which generates plasma in a process chamber, the power supply control device comprising: a radio frequency power supply which supplies a power to the plasma generation unit; a storage unit which stores matching information including a first matching value, a second matching value, and a third matching value, the first matching value corresponding to process information of a first process condition, the second matching value corresponding to process information of a second process condition, and the third matching value corresponding to process information of a transient state where the first process condition is being switched to the second process condition; and a matching circuit which matches impedances based on the matching information.
地址 Tokyo JP