发明名称 |
Non-volatile memory device with vertical memory cells |
摘要 |
A non-volatile memory device includes a plurality of gate electrodes stacked over a semiconductor substrate and stretched in a first direction along the semiconductor substrate and a plurality of junction layers having a first region protruding from the semiconductor substrate and crossing the gate electrodes and a second region formed between the gate electrodes. |
申请公布号 |
US8759902(B2) |
申请公布日期 |
2014.06.24 |
申请号 |
US201113333893 |
申请日期 |
2011.12.21 |
申请人 |
Hynix Semiconductor Inc. |
发明人 |
Ahn Jung-Ryul |
分类号 |
H01L29/792;H01L27/115;H01L29/66;H01L21/28 |
主分类号 |
H01L29/792 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A non-volatile memory device, comprising:
a plurality of gate electrodes stacked in a vertical direction from a semiconductor substrate and extended to a first direction along the semiconductor substrate; and a plurality of junction layers having a first region protruding from the semiconductor substrate and extended to a second direction that crosses the gate electrodes, and a second region formed between the gate electrodes, wherein the gate electrodes and the second region are extended in the vertical direction from the semiconductor substrate, wherein the first region and the second region comprise polysilicon.
|
地址 |
Gyeonggi-do KR |