发明名称 Chemical mechanical polishing process
摘要 A chemical mechanical polishing process includes placing a substrate on a first polishing pad of a first platen, wherein the substrate has a bulk metal layer and a barrier layer; polishing the bulk metal layer by using the first polishing pad having a hardness of above 50 (Shore D) until the barrier layer is exposed; polishing the barrier layer on a second polishing pad of a second platen after removing the bulk metal layer, wherein the second polishing pad has a hardness ranging between 40 and 50 (Shore D) and includes an upper layer and a lower backing layer and the upper layer has a hardness less than 50 (Shore D).
申请公布号 US8759218(B2) 申请公布日期 2014.06.24
申请号 US201113339350 申请日期 2011.12.28
申请人 United Microelectronics Corp. 发明人 Neo Boon-Tiong;Lin Chin-Kun;Lau Lee-Lee
分类号 H01L21/302 主分类号 H01L21/302
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A chemical mechanical polishing process, comprising: placing a substrate on a first polishing pad of a first platen, wherein the substrate has a bulk metal layer and a barrier layer; polishing the bulk metal layer by using the first polishing pad having a hardness of above 50 (Shore D) until the barrier layer is exposed; after removing the bulk metal layer, polishing the barrier layer on a second polishing pad of a second platen, wherein the second polishing pad has a hardness ranging between 40 and 50 (Shore D) and comprises an upper layer and a lower backing layer and said upper layer has a hardness less than 50 (Shore D).
地址 Science-Based Industrial Park, Hsin-Chu TW