发明名称 |
Chemical mechanical polishing process |
摘要 |
A chemical mechanical polishing process includes placing a substrate on a first polishing pad of a first platen, wherein the substrate has a bulk metal layer and a barrier layer; polishing the bulk metal layer by using the first polishing pad having a hardness of above 50 (Shore D) until the barrier layer is exposed; polishing the barrier layer on a second polishing pad of a second platen after removing the bulk metal layer, wherein the second polishing pad has a hardness ranging between 40 and 50 (Shore D) and includes an upper layer and a lower backing layer and the upper layer has a hardness less than 50 (Shore D). |
申请公布号 |
US8759218(B2) |
申请公布日期 |
2014.06.24 |
申请号 |
US201113339350 |
申请日期 |
2011.12.28 |
申请人 |
United Microelectronics Corp. |
发明人 |
Neo Boon-Tiong;Lin Chin-Kun;Lau Lee-Lee |
分类号 |
H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A chemical mechanical polishing process, comprising:
placing a substrate on a first polishing pad of a first platen, wherein the substrate has a bulk metal layer and a barrier layer; polishing the bulk metal layer by using the first polishing pad having a hardness of above 50 (Shore D) until the barrier layer is exposed; after removing the bulk metal layer, polishing the barrier layer on a second polishing pad of a second platen, wherein the second polishing pad has a hardness ranging between 40 and 50 (Shore D) and comprises an upper layer and a lower backing layer and said upper layer has a hardness less than 50 (Shore D).
|
地址 |
Science-Based Industrial Park, Hsin-Chu TW |