发明名称 Forming array contacts in semiconductor memories
摘要 Array contacts for semiconductor memories may be formed using a first set of parallel stripe masks and subsequently a second set of parallel stripe masks transverse to the first set. For example, one set of masks may be utilized to etch a dielectric layer, to form parallel spaced trenches. Then the trenches may be filled with a sacrificial material. That sacrificial material may then be masked transversely to its length and etched, for example. The resulting openings may be filled with a metal to form array contacts.
申请公布号 US8759980(B2) 申请公布日期 2014.06.24
申请号 US201314066340 申请日期 2013.10.29
申请人 Micron Technology, Inc. 发明人 Somaschini Roberto;Vaccaro Alessandro;Tessariol Paolo;Albini Giulio
分类号 G11C11/24 主分类号 G11C11/24
代理机构 Dorsey & Whitney LLP 代理人 Dorsey & Whitney LLP
主权项 1. A semiconductor device comprising: a semiconductor memory array; a dielectric material over said memory array; a plurality of parallel spaced filled trenches in said dielectric material; a plurality of spaced openings along the length of each said trenches; and array contacts formed in said plurality of openings.
地址 Boise ID US