发明名称 |
Forming array contacts in semiconductor memories |
摘要 |
Array contacts for semiconductor memories may be formed using a first set of parallel stripe masks and subsequently a second set of parallel stripe masks transverse to the first set. For example, one set of masks may be utilized to etch a dielectric layer, to form parallel spaced trenches. Then the trenches may be filled with a sacrificial material. That sacrificial material may then be masked transversely to its length and etched, for example. The resulting openings may be filled with a metal to form array contacts. |
申请公布号 |
US8759980(B2) |
申请公布日期 |
2014.06.24 |
申请号 |
US201314066340 |
申请日期 |
2013.10.29 |
申请人 |
Micron Technology, Inc. |
发明人 |
Somaschini Roberto;Vaccaro Alessandro;Tessariol Paolo;Albini Giulio |
分类号 |
G11C11/24 |
主分类号 |
G11C11/24 |
代理机构 |
Dorsey & Whitney LLP |
代理人 |
Dorsey & Whitney LLP |
主权项 |
1. A semiconductor device comprising:
a semiconductor memory array; a dielectric material over said memory array; a plurality of parallel spaced filled trenches in said dielectric material; a plurality of spaced openings along the length of each said trenches; and array contacts formed in said plurality of openings.
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地址 |
Boise ID US |