发明名称 |
Transistor having notched fin structure and method of making the same |
摘要 |
A transistor includes a notched fin covered under a shallow trench isolation layer. One or more notch may be used, the size of which may vary along a lateral direction of the fin. In some embodiments, The notch is formed using anisotropic wet etching that is selective according to silicon orientation. Example wet etchants are tetramethylammonium hydroxide (TMAH) or potassium hydroxide (KOH). |
申请公布号 |
US8759943(B2) |
申请公布日期 |
2014.06.24 |
申请号 |
US201012900626 |
申请日期 |
2010.10.08 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Tseng Chih-Hung;Lin Da-Wen;Chan Chien-Tai;Lin Chia-Pin;Weng Li-Wen;Chang An-Shen;Wu Chung-Cheng |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
Lowe Hauptman & Ham, LLP |
代理人 |
Lowe Hauptman & Ham, LLP |
主权项 |
1. An apparatus comprising:
a semiconductor substrate; a fin field-effect transistor (FinFET) on the substrate, said fin having a notched portion and a bottom portion having a substantially constant width between the notched portion and the semiconductor substrate, wherein the notched portion has a width less than a width of the bottom portion; and, a shallow trench isolation (STI) layer covering and filling the notched portion of the notched fin, the notched portion having a surface along a (1-1-1) plane.
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地址 |
TW |