发明名称 CONFORMAL FILM DEPOSITION FOR GAPFILL
摘要 <p>PROBLEM TO BE SOLVED: To provide a method and apparatus for conformally depositing a dielectric oxide in high aspect ratio gaps in a substrate.SOLUTION: A substrate is provided with one or more gaps into a reaction chamber where each gap has a depth to width aspect ratio of greater than about 5:1. A first dielectric oxide layer is deposited in the one or more gaps by CFD. A portion of the first dielectric oxide layer is etched using a plasma etch, where etching the portion of the first dielectric oxide layer occurs at a faster rate near a top surface than near a bottom surface of each gap so that the first dielectric oxide layer has a tapered profile from the top surface to the bottom surface of each gap. A second dielectric oxide layer is deposited in the one or more gaps over the first dielectric oxide layer by CFD.</p>
申请公布号 JP2014112668(A) 申请公布日期 2014.06.19
申请号 JP20130230782 申请日期 2013.11.07
申请人 NOVELLUS SYSTEMS INCORPORATED 发明人 SHANKAR SWAMINATHAN;SCHRAVENDIJK BART J VAN;ADRIEN LAVOIE;SESHA VARADARAJAN;JASON DAEJIN PARK;MICHAL DANEK;SHODA NAOHIRO
分类号 H01L21/316;C23C16/42;C23C16/455;H01L21/3065 主分类号 H01L21/316
代理机构 代理人
主权项
地址
您可能感兴趣的专利