发明名称 LITHOGRAPHY SYSTEM AND LITHOGRAPHY METHOD
摘要 A lithography system may include a wafer stage. The wafer stage may include a wafer mounting part configured to carry a wafer and configured to oscillate along a plane that is parallel to a top surface of the wafer in a wafer exposure process. The wafer stage may further include a driving device configured to affect an oscillatory movement of the wafer mounting part in the wafer exposure process.
申请公布号 US2014168626(A1) 申请公布日期 2014.06.19
申请号 US201313924325 申请日期 2013.06.21
申请人 Semiconductor Manufacturing International Corporation (Shanghai) 发明人 WU Qiang
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项 1. A wafer stage comprising: a wafer mounting part configured to carry a wafer and configured to oscillate along a plane that is parallel to a top surface of the wafer in a wafer exposure process; and a driving device configured to affect an oscillatory movement of the wafer mounting part in the wafer exposure process.
地址 Shanghai CN