发明名称 APPARATUS FOR PROVIDING PLASMA TO A PROCESS CHAMBER
摘要 <p>Apparatus for providing plasma to a process chamber may include an electrode; a first ground plate disposed beneath the electrode defining a cavity therebetween; an insulator disposed between the electrode and first ground plate to prevent direct contact therebetween; a second ground plate disposed beneath the first ground plate defining a first channel; a plurality of first through holes through the first ground plate to fluidly couple the channel and cavity; a first gas inlet coupled to the first channel; a third ground plate disposed beneath the second ground plate defining a second channel; a plurality of conduits through the ground plates to fluidly couple the cavity to an area beneath the third ground plate; a plurality of gas outlet holes through the third ground plate to fluidly couple the second channel to the area beneath the third ground plate; and a second gas inlet coupled to the second channel.</p>
申请公布号 WO2014093034(A1) 申请公布日期 2014.06.19
申请号 WO2013US72430 申请日期 2013.11.27
申请人 APPLIED MATERIALS, INC. 发明人 KAO, CHIEN-TEH;LAM, HYMAN W. H.
分类号 H01L21/205 主分类号 H01L21/205
代理机构 代理人
主权项
地址