发明名称 |
APPARATUS FOR PROVIDING PLASMA TO A PROCESS CHAMBER |
摘要 |
<p>Apparatus for providing plasma to a process chamber may include an electrode; a first ground plate disposed beneath the electrode defining a cavity therebetween; an insulator disposed between the electrode and first ground plate to prevent direct contact therebetween; a second ground plate disposed beneath the first ground plate defining a first channel; a plurality of first through holes through the first ground plate to fluidly couple the channel and cavity; a first gas inlet coupled to the first channel; a third ground plate disposed beneath the second ground plate defining a second channel; a plurality of conduits through the ground plates to fluidly couple the cavity to an area beneath the third ground plate; a plurality of gas outlet holes through the third ground plate to fluidly couple the second channel to the area beneath the third ground plate; and a second gas inlet coupled to the second channel.</p> |
申请公布号 |
WO2014093034(A1) |
申请公布日期 |
2014.06.19 |
申请号 |
WO2013US72430 |
申请日期 |
2013.11.27 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
KAO, CHIEN-TEH;LAM, HYMAN W. H. |
分类号 |
H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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