| 摘要 |
<p>POINT SIZE LIGHT ILLUMINATION IN METROLOGY SYSTEMS FOR IN-SITU SURGICAL APPLICATIONS A metrology method includes the steps of positioning a point source projector (100) at a known distance from a target site ("S"), projecting a light beam (120) through a semi transparent mask (104), forming a magnified pattern (116) on the target site ("S") from the light beam (120), visually inspecting a portion of the magnified pattern (116) that is formed on the target site ("S"), and determining a measurement of the target site ("S") based on the known dimensions of the mask pattern (106), a magnification factor ("M"), and the portion of the magnified pattern (116) that is formed on the target site ("S"). The light beam (120) diverges from a point and the semi-transparent mask (106) has a mask pattern (106) of known dimensions. The magnified pattern (116) is magnified from the mask pattern (106) by the magnification factor ("M"). -1'06 116 102 -L---- d, d 10 "T" d</p> |
