发明名称 |
APPARATUS FOR PROVIDING PLASMA TO A PROCESS CHAMBER |
摘要 |
Embodiments of apparatus for providing plasma to a process chamber are provided. In some embodiments, an apparatus may include a first ground plate; an electrode disposed beneath and spaced apart from the first ground plate by a first electrical insulator to define a first gap between the first ground plate and the electrode; a second ground plate disposed beneath and spaced apart from the electrode by a second electrical insulator to define a second gap between the electrode and the second ground plate; a gas inlet to provide a process gas to the first gap; a plurality of through holes disposed through the electrode coupling the first gap to the second gap; and a plurality of first gas outlet holes disposed through the second ground plate to fluidly couple the second gap to an area beneath the second plate. |
申请公布号 |
US2014165911(A1) |
申请公布日期 |
2014.06.19 |
申请号 |
US201213715281 |
申请日期 |
2012.12.14 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
KAO CHIEN-TEH;LAM HYMAN W.H.;DENNY NICHOLAS R.;OR DAVID T.;CHANG MEI;NARASIMHAN MURALI K. |
分类号 |
H01J37/32 |
主分类号 |
H01J37/32 |
代理机构 |
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代理人 |
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主权项 |
1. An apparatus for providing a plasma to a process chamber, comprising:
a first ground plate; an electrode disposed beneath and spaced apart from the first ground plate by a first electrical insulator to define a first gap between the first ground plate and the electrode; a second ground plate disposed beneath and spaced apart from the electrode by a second electrical insulator to define a second gap between the electrode and the second ground plate; a gas inlet to provide a process gas to the first gap; a plurality of through holes disposed through the electrode coupling the first gap to the second gap; and a plurality of first gas outlet holes disposed through the second ground plate to fluidly couple the second gap to an area beneath the second plate.
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地址 |
Santa Clara CA US |