发明名称 MASK INSPECTION APPARATUS AND METHOD OF CONTROLLING THE SAME
摘要 A mask inspection apparatus includes a mask transfer unit configured to transfer a mask in one of a first direction and a direction opposite to the first direction, a displacement sensor unit configured to measure a distance to a sheet of the mask transferred by the mask transfer unit, a photographic unit configured to photograph the sheet of the mask transferred by the mask transfer unit, a control unit configured to send a height control signal for controlling a height of the photographic unit according to the measured distance, and a height control unit configured to control the height of the photographic unit according to the height control signal sent by the control unit.
申请公布号 US2014168410(A1) 申请公布日期 2014.06.19
申请号 US201313966271 申请日期 2013.08.13
申请人 Samsung Display Co., Ltd. 发明人 Park Hun-Jung
分类号 H04N5/232 主分类号 H04N5/232
代理机构 代理人
主权项 1. A mask inspection apparatus comprising: a mask transfer unit configured to transfer a mask in one of a first direction and a direction opposite to the first direction; a displacement sensor unit configured to measure a distance to a sheet of the mask transferred by the mask transfer unit; a photographic unit configured to photograph the sheet of the mask transferred by the mask transfer unit; a control unit configured to send a height control signal according to the distance measured by the displacement sensor unit; and a height control unit configured to control the height of the photographic unit according to the height control signal sent by the control unit.
地址 Yongin-City KR