ELECTROMAGNETIC INTERFERENCE MEASURING DEVICE AND ELECTROMAGNETIC INTERFERENCE MEASURING METHOD

摘要

Provided is an electromagnetic interference (EMI) measuring device. The EMI measuring device according to the present invention includes an electromagnetic wave eliminating unit eliminating remaining electromagnetic waves from a DUT in response to an eliminating control signal of the control unit. The control unit may calculate EMI of the DUT on the basis of a measured result measured before the elimination of remaining electromagnetic waves. The EMI measuring device according to the present invention may compensate for an error due to remaining electromagnetic waves and measure EMI at high accuracy.

主权项

1. An electromagnetic interference (EMI) measuring device, comprising:
a control unit; an electromagnetic wave generating unit generating a first electromagnetic wave in response to a frequency control signal of the control unit; an electromagnetic wave applying unit providing the first electromagnetic wave to a device under test (DUT); a measuring unit measuring, in response to a measuring control signal of the control unit, a second electromagnetic wave that is emitted from the DUT in response to the first electromagnetic wave; and an electromagnetic wave eliminating unit eliminating remaining electromagnetic waves from the DUT in response to an eliminating control signal of the control unit, and wherein the control unit calculates EMI of the DUT on the basis of a measured result of the measuring unit.