发明名称 VALIDATING OPERATION OF SYSTEM-ON-CHIP CONTROLLER FOR STORAGE DEVICE USING PROGRAMMABLE STATE MACHINE
摘要 A system-on-chip includes a storage controller, a read channel integrated circuit, a programmable state machine controller, a switching circuit, a buffer memory, and an interface to access the buffer memory. The switching circuit connects the storage controller or the programmable state machine controller to the read channel integrated circuit. The interface is used to store test control data in the buffer memory. In a given test mode, the switching circuit switchably connects the programmable state machine controller to the read channel integrated circuit. The programmable state machine controller is enabled to access the test control data from the buffer memory, and to process the test control data to generate test signals that are applied to operate the read channel integrated circuit and validate operation of the system-on-chip based on the operation of the read channel integrated circuit.
申请公布号 US2014173346(A1) 申请公布日期 2014.06.19
申请号 US201213720103 申请日期 2012.12.19
申请人 LSI CORPORATION 发明人 Bastimane Sachin Shivanand
分类号 G11C29/12 主分类号 G11C29/12
代理机构 代理人
主权项 1. A system-on-chip for controlling a storage system, the system-on-chip comprising: a storage controller; a read channel integrated circuit; a programmable state machine controller; a switching circuit to switchably connect one of the storage controller and the programmable state machine controller to the read channel integrated circuit; a buffer memory connected to the programmable state machine controller; an interface for externally accessing the buffer memory and storing test control data in the buffer memory; wherein in a test mode to validate operation of the system-on-chip, the switching circuit is controlled to switchably connect the programmable state machine controller to the read channel integrated circuit, and the programmable state machine controller is enabled to access test control data from the buffer memory, and process the test control data to generate test signals that are applied to operate the read channel integrated circuit and validate operation of the system-on-chip based on the operation of the read channel integrated circuit.
地址 Milpitas CA US