发明名称 |
STACK TYPE SEMICONDUCTOR CIRCUIT WITH IMPEDANCE CALIBRATION |
摘要 |
A stack type semiconductor circuit includes a plurality of semiconductor chips stacked therein, wherein the plurality of semiconductor chips are configured to share impedance calibration information. The plurality of semiconductor chips include at least one resistance value of an external resistor and an impedance calibration signal as the impedance calibration information. |
申请公布号 |
US2014167281(A1) |
申请公布日期 |
2014.06.19 |
申请号 |
US201313845628 |
申请日期 |
2013.03.18 |
申请人 |
SK hynix Inc. |
发明人 |
BYEON Sang Jin |
分类号 |
H01L23/64 |
主分类号 |
H01L23/64 |
代理机构 |
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代理人 |
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主权项 |
1. A stack type semiconductor circuit, in which a plurality of semiconductor chips are stacked, wherein the plurality of semiconductor chips are configured to share an impedance calibration information.
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地址 |
US |