发明名称 SILICON GERMANIUM AND GERMANIUM MULTIGATE AND NANOWIRE STRUCTURES FOR LOGIC AND MULTILEVEL MEMORY APPLICATIONS
摘要 A method to provide a transistor or memory cell structure. The method comprises: providing a substrate including a lower Si substrate and an insulating layer on the substrate; providing a first projection extending above the insulating layer, the first projection including an Si material and a Sil-xGex material; and exposing the first projection to preferential oxidation to yield a second projection including a center region comprising Ge/Sil-yGey and a covering region comprising SiO2 and enclosing the center region.
申请公布号 US2014170817(A1) 申请公布日期 2014.06.19
申请号 US201414184999 申请日期 2014.02.20
申请人 Jin Been-Yih;Doyle Brian S.;Kavalieros Jack T.;Chau Robert S. 发明人 Jin Been-Yih;Doyle Brian S.;Kavalieros Jack T.;Chau Robert S.
分类号 H01L29/10;H01L29/66;H01L29/06 主分类号 H01L29/10
代理机构 代理人
主权项 1. A method to form a microelectronic structure comprising: providing a substrate including a lower Si substrate and an insulating layer on the substrate; forming a projection on the substrate projecting above the insulating layer and including a center region comprising a floating nanowire channel comprising Ge/Sil-yGEy and a covering region enclosing the center region, wherein the covering region comprises an insulation covering surrounding the nanowire channel and electrically insulating the nanowire channel.
地址 Lake Oswego OR US