发明名称 THIN FILM TRANSISTOR, THIN FILM TRANSISTOR ARRAY PANEL, AND MANUFACTURING METHOD OF THIN FILM TRANSISTOR
摘要 The inventive concept relates to a thin film transistor and a thin film transistor array panel and, in detail, relates to a thin film transistor including an oxide semiconductor. A thin film transistor according to an exemplary embodiment of the inventive concept includes: a gate electrode; a gate insulating layer positioned on or under the gate electrode; a first semiconductor and a second semiconductor that overlap the gate electrode with the gate insulating layer interposed therebetween, the first semiconductor and the second semiconductor contacting each other; a source electrode connected to the second semiconductor; and a drain electrode connected to the second semiconductor and facing the source electrode, wherein the second semiconductor includes gallium (Ga) that is not included in the first semiconductor, and a content of gallium (Ga) in the second semiconductor is greater than 0 at. % and less than or equal to about 33 at. %.
申请公布号 US2014167038(A1) 申请公布日期 2014.06.19
申请号 US201414179452 申请日期 2014.02.12
申请人 KABUSHIKI KAISHA KOBE SEIKO SHO (Kobe Steel, Ltd.) 发明人 AHN Byung Du;LIM Ji Hun;KIM Gun Hee;LEE Kyoung Won;LEE Je Hun;GOTO HIROSHI;MIKI AYA;MORITA SHINYA;KUGIMIYA TOSHIHIRO;KIM Yeon Hong;MO Yeon Gon;KIM Kwang Suk
分类号 H01L29/786 主分类号 H01L29/786
代理机构 代理人
主权项 1. A thin film transistor comprising: a gate electrode; a gate insulating layer positioned on or under the gate electrode; a first semiconductor and a second semiconductor that overlap the gate electrode with the gate insulating layer interposed therebetween, the first semiconductor and the second semiconductor contacting each other; a source electrode connected to the second semiconductor; and a drain electrode connected to the second semiconductor and facing the source electrode, wherein the second semiconductor includes gallium (Ga) that is not included in the first semiconductor, and a content of gallium (Ga) in the second semiconductor is greater than 0 at. % and less than or equal to about 33 at. %.
地址 Kobe-shi JP