发明名称 MATERIAL IDENTIFICATION FROM A SPECTRAL FILTERED PATTERNED IMAGE WITHOUT DEMOSAICING
摘要 What is disclosed is a system and method for processing image data acquired using a multi-band infrared camera system with a spectral mosaic filter arranged in a geometric pattern without having to perform a demosaicing that is typical with processing data from an array of sensors. In one embodiment, image data that has been captured using a camera system that has a spectral filter mosaic comprising a plurality of spectral filters arrayed on a grid. A material index is determined, using intensity values collected by sensor elements associated with this cell's respective spectral filters. All of the material indices collectively generate a material index image. Thereafter, material identification is performed on the material index image using, for example, pixel classification. Because the demosaicing step can be effectively avoided, image processing time is reduced. The teachings hereof find their uses in a wide array of applications including automated HOV/HOT violation detection.
申请公布号 US2014168421(A1) 申请公布日期 2014.06.19
申请号 US201213715446 申请日期 2012.12.14
申请人 XEROX CORPORATION 发明人 XU Beilei;MESTHA Lalit Keshav;WANG Yao Rong;PAUL Peter
分类号 G01N21/01 主分类号 G01N21/01
代理机构 代理人
主权项 1. A method for material identification using a patterned image acquired by a multi-band IR camera system with a mosaic of spectral filter elements arrayed in a geometric pattern, the method comprising: receiving a patterned image captured by a multi-band IR camera system with an array of spectral filter cells arranged in a geometric pattern, each of said spectral filter cells comprises a plurality of spectral filter elements each filtering source light by a desired wavelength range of interest, each spectral filter element being aligned with sensor elements in said camera's detector array, each sensor element collecting separate filtered intensity values for each respective pixel location in said image; determining, for each spectral filter cell, a material index using intensity values collected by said sensor elements; and performing material identification on said image using at least a portion of said material indices.
地址 Norwalk CT US