发明名称 SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD
摘要 Various embodiments provide a semiconductor structure and fabrication method. An exemplary semiconductor structure can include a semiconductor substrate having an isolation trench formed in the semiconductor substrate. A first barrier layer can be disposed on a bottom surface and a sidewall of the isolation trench. A light absorption layer can be disposed at least on a surface portion of the first barrier layer over the bottom surface of the isolation trench. A second barrier layer can fill the isolation trench to form an isolation structure in the semiconductor substrate. The isolation structure can have a top surface flushed with or over a top surface of the semiconductor substrate.
申请公布号 US2014167210(A1) 申请公布日期 2014.06.19
申请号 US201313897360 申请日期 2013.05.18
申请人 Semiconductor Manufacturing International Corp. 发明人 HU DANIEL
分类号 H01L29/06;H01L21/762 主分类号 H01L29/06
代理机构 代理人
主权项 1. A semiconductor structure comprising: a semiconductor substrate including an isolation trench; a first barrier layer disposed on a bottom surface and a sidewall of the isolation trench; a light absorption layer disposed at least on a surface portion of the first barrier layer over the bottom surface of the isolation trench; and a second barrier layer filling the isolation trench to form an isolation structure in the semiconductor substrate, wherein the isolation structure includes the first barrier layer, the light absorption layer, and the second barrier layer and has a top surface flushed with or over a top surface of the semiconductor substrate.
地址 Shanghai CN