Gate Drive Circuits that Control Electromagnetic Interference and Switching Losses and Related Methods

摘要

Gate drive circuits for use with semiconductor switching devices are provided. The gate drive circuits include a gate resistor of the semiconductor switching device; a resistance control module in series with the gate resistor of the semiconductor switching device, the resistance control module being configured to provide a first resistance that controls electromagnetic interference under normal operating conditions; and a second resistance during abnormal events; and an abnormal event detector coupled to the resistance control module, the abnormal event detector configured to detect an abnormal event and send an abnormal event signal to the resistance control module responsive to detection of the abnormal event. The resistance control module is configured to provide the second resistance by shorting the resistance provided by the resistance control module responsive to the abnormal event signal to provide increased gate drive and reduced switching losses during the abnormal event.

主权项

1. A gate drive circuit for use with a semiconductor switching device, the gate drive circuit comprising:
a gate resistor of the semiconductor switching device; a resistance control module in series with the gate resistor of the semiconductor switching device, the resistance control module being configured to provide a first resistance that controls electromagnetic interference under normal operating conditions and a second resistance during abnormal events; and an abnormal event detector coupled to the resistance control module, the abnormal event detector configured to detect an abnormal event and send an abnormal event signal to the resistance control module responsive to detection of the abnormal event, wherein the resistance control module is configured to provide the second resistance provided by the resistance control module responsive to the abnormal event signal to provide increased gate drive and reduced switching losses during the abnormal event.