| 发明名称 |
RIGID PROBE WITH COMPLIANT CHARACTERISTICS |
| 摘要 |
A probe conducts testing of a circuit. The probe includes a base coupled to a substrate. The probe also includes a cantilever attached to the base at a first end, the cantilever deflecting from a first position to a second position in which a second end opposite the first end is in contact with the substrate and to move between the second position and the first position based on movement of a compliant bump of the circuit, and a probe tip attached to the cantilever at the second end, the probe tip maintaining contact with the compliant bump of the circuit. |
| 申请公布号 |
US2014167801(A1) |
申请公布日期 |
2014.06.19 |
| 申请号 |
US201213720092 |
申请日期 |
2012.12.19 |
| 申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Audette David M.;Fregeau Dustin;Gardell David L.;Wagner Grant W. |
| 分类号 |
G01R1/067 |
主分类号 |
G01R1/067 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A probe to conduct testing of a circuit, the probe comprising:
a base coupled to a substrate; a cantilever attached to the base at a first end, the cantilever configured to deflect from a first position to a second position in which a second end opposite the first end is in contact with the substrate and to move between the second position and the first position based on a movement of a compliant bump of the circuit; and a probe tip attached to the cantilever at the second end, the probe tip configured to maintain contact with the compliant bump of the circuit.
|
| 地址 |
Armonk NY US |
