发明名称 |
SOURCE/DRAIN EXTENSION CONTROL FOR ADVANCED TRANSISTORS |
摘要 |
A planar transistor with improved performance has a source and a drain on a semiconductor substrate that includes a substantially undoped channel extending between the source and the drain. A gate is positioned over the substantially undoped channel on the substrate. Implanted source/drain extensions contact the source and the drain, with the implanted source/drain extensions having a dopant concentration of less than about 1×1019 atoms/cm3, or alternatively, less than one-quarter the dopant concentration of the source and the drain. |
申请公布号 |
US2014167157(A1) |
申请公布日期 |
2014.06.19 |
申请号 |
US201414188493 |
申请日期 |
2014.02.24 |
申请人 |
SuVolta, Inc. |
发明人 |
Ranade Pushkar;Shifren Lucian;Sonkusale Sachin R. |
分类号 |
H01L29/78;H01L27/088 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor die, comprising:
a plurality of transistors, the plurality of transistors each having:
a gate with an effective gate length;a source region;a drain region;an epitaxially grown channel layer below the gate and extending between the source region and the drain region;a first highly doped layer below the channel layer and coextensive therewith, the first highly doped layer effective to set a depletion depth for said plurality of transistors; and wherein some of the plurality of transistors have a second highly doped layer below the channel layer and above the first highly doped layer; wherein some of the plurality of transistors include a source and drain extension region; and wherein some of the plurality of transistors are haloless.
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地址 |
Los Gatos CA US |