发明名称 |
CENTIMETER-SCALE HIGH RESOLUTION METROLOGY OF ENTIRE CVD GROWN GRAPHENE SHEETS |
摘要 |
A method for quick and easy identification of layer thickness and uniformity of entire large-area graphene samples on arbitrary substrates utilizing fluorescence quenching microscopy in which a polymer mixed with fluorescent dye is applied onto the graphene, then viewing the sample under a fluorescence microscope. A large-scale, high-resolution montage image of the sample is obtained for histogram-based segmentation based on contrast relative to the substrates. |
申请公布号 |
WO2014033532(A3) |
申请公布日期 |
2014.06.19 |
申请号 |
WO2013IB01968 |
申请日期 |
2013.07.03 |
申请人 |
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
发明人 |
OZKAN, CENGIZ, S.;OZKAN, MIHRIMAH;KYLE, JENNIFER REIBER |
分类号 |
G03F1/00;C01B21/06 |
主分类号 |
G03F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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