PROGRAMMABLE BUILT-IN-SELF TESTER (BIST) IN MEMORY CONTROLLER

摘要

Some novel features pertain to a memory controller that includes a memory controller logic, a built-in-self-tester (BIST) logic, and a switch. The memory controller logic is for controlling memory on a memory die. The built-in-self tester (BIST) logic is for testing the memory. The switch is coupled to the BIST logic and the memory. In some implementations, the BIST logic bypasses the memory controller logic when testing the memory by accessing the memory through the switch. The switch may be controlled by the BIST logic. In some implementations, the switch is coupled to the memory controller logic. The switch may control data to the memory that is transmitted from the memory controller logic and the BIST logic based on priority of the data.

主权项

1. A memory controller comprising:
a memory controller logic for controlling memory on a memory die; a built-in-self tester (BIST) logic for testing the memory; and a switch coupled to the BIST logic and the memory, wherein the BIST logic bypasses the memory controller logic when testing the memory by accessing the memory through the switch.