发明名称 |
ZINC OXIDE FILM METHOD AND STRUCTURE FOR CIGS CELL |
摘要 |
A method for fabricating a thin film photovoltaic device. The method includes providing a substrate comprising an absorber layer and an overlying window layer. The substrate is loaded into a chamber and subjected to a vacuum environment. The vacuum environment is at a pressure ranging from 0.1 Torr to about 0.02 Torr. In a specific embodiment, a mixture of reactant species derived from diethylzinc species, water species and a carrier gas is introduced into the chamber. The method further introduces a diborane species using a selected flow rate into the mixture of reactant species. A zinc oxide film is formed overlying the window layer to define a transparent conductive oxide using the selected flow rate to provide a resistivity of about 2.5 milliohm-cm and less and an average grain size of about 3000 to 5000 Angstroms |
申请公布号 |
US2014170808(A1) |
申请公布日期 |
2014.06.19 |
申请号 |
US201314025592 |
申请日期 |
2013.09.12 |
申请人 |
Stion Corporation |
发明人 |
Wieting Robert D. |
分类号 |
H01L31/18 |
主分类号 |
H01L31/18 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a zinc oxide film for a photovoltaic device, the method comprising:
providing a substrate in a deposition chamber, wherein the substrate comprises an absorber layer and an overlying window layer; subjecting the deposition chamber to a vacuum pressure ranging from about 0.1 Torr to about 0.02 Torr; and flowing a zinc-containing precursor and an oxygen-containing precursor into the deposition chamber to form a zinc oxide film over the window layer.
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地址 |
San Jose CA US |