发明名称 ZINC OXIDE FILM METHOD AND STRUCTURE FOR CIGS CELL
摘要 A method for fabricating a thin film photovoltaic device. The method includes providing a substrate comprising an absorber layer and an overlying window layer. The substrate is loaded into a chamber and subjected to a vacuum environment. The vacuum environment is at a pressure ranging from 0.1 Torr to about 0.02 Torr. In a specific embodiment, a mixture of reactant species derived from diethylzinc species, water species and a carrier gas is introduced into the chamber. The method further introduces a diborane species using a selected flow rate into the mixture of reactant species. A zinc oxide film is formed overlying the window layer to define a transparent conductive oxide using the selected flow rate to provide a resistivity of about 2.5 milliohm-cm and less and an average grain size of about 3000 to 5000 Angstroms
申请公布号 US2014170808(A1) 申请公布日期 2014.06.19
申请号 US201314025592 申请日期 2013.09.12
申请人 Stion Corporation 发明人 Wieting Robert D.
分类号 H01L31/18 主分类号 H01L31/18
代理机构 代理人
主权项 1. A method of forming a zinc oxide film for a photovoltaic device, the method comprising: providing a substrate in a deposition chamber, wherein the substrate comprises an absorber layer and an overlying window layer; subjecting the deposition chamber to a vacuum pressure ranging from about 0.1 Torr to about 0.02 Torr; and flowing a zinc-containing precursor and an oxygen-containing precursor into the deposition chamber to form a zinc oxide film over the window layer.
地址 San Jose CA US