发明名称 |
Thermal Processing Utilizing Independently Controlled Elemental Reactant Vapor Pressures and/or Indirect Cooling |
摘要 |
A machine includes a thermal ramp chamber; a thermal soak chamber coupled to the thermal ramp chamber; and a cooling chamber coupled to the thermal soak chamber. The cooling chamber can be an indirect cooling chamber including a thermal buffer that includes a substrate carrier. Each of the chambers can include an independently controlled elemental reactant source containing and supplying vapor having both i) independent control of a total vapor pressure of an elemental reactant containing vapor and ii) independent control of a partial vapor pressure of an elemental reactant vapor within that chamber. |
申请公布号 |
US2014170805(A1) |
申请公布日期 |
2014.06.19 |
申请号 |
US201313919228 |
申请日期 |
2013.06.17 |
申请人 |
HelioVolt Corporation |
发明人 |
Miller Michael Floyd;Sang Baosheng;Lu Dingyuan;Stanbery Billy J. |
分类号 |
H01L31/18;H01L31/032 |
主分类号 |
H01L31/18 |
代理机构 |
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代理人 |
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主权项 |
1. A method, comprising: transferring a substrate from a loadlock into a thermal ramp chamber; then thermally processing the substrate in the thermal ramp chamber wherein the thermal ramp chamber includes a first independently controlled elemental reactant source containing and supplying vapor having both i) independent control of a total vapor pressure of a first elemental reactant containing vapor and ii) independent control of a partial vapor pressure of first elemental reactant vapor within the thermal ramp chamber; then transferring the substrate from the thermal ramp chamber to a thermal soak chamber; then soaking the substrate in the thermal soak chamber wherein the thermal soak chamber includes a second independently controlled elemental reactant source containing and supplying vapor having both i) independent control of a total vapor pressure of a second elemental reactant containing vapor and ii) independent control of a partial vapor pressure of a second elemental reactant vapor within the thermal soak chamber; then transferring the substrate from the thermal soak chamber to a cooling chamber; and then cooling the substrate in the cooling chamber wherein the cooling chamber includes a third independently controlled elemental reactant source containing and supplying vapor having both i) independent control of a total vapor pressure of a third elemental reactant containing vapor and ii) independent control of a partial vapor pressure of a third elemental reactant vapor within the cooling chamber.
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地址 |
Austin TX US |