发明名称 SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes: a p-type semiconductor layer; an n-type semiconductor layer connected with the p-type semiconductor layer; a first electrode layer formed on the n-type semiconductor layer; and a second electrode layer formed on the p-type semiconductor layer. The first electrode layer and the second electrode layer are electrically connected such as to each operate at an identical potential. The first electrode layer is connected with a connection line which is a part of a peripheral line of a joint interface between the p-type semiconductor layer and the n-type semiconductor layer on an interface side between the second electrode layer and the p-type semiconductor layer, with a surface of the p-type semiconductor layer and with at least a part of a surface of the second electrode layer which is opposite to a surface of the second electrode layer that is in contact with the p-type semiconductor layer.
申请公布号 US2014167147(A1) 申请公布日期 2014.06.19
申请号 US201314104962 申请日期 2013.12.12
申请人 TOYODA GOSEI CO., LTD. 发明人 Oka Toru;Tanaka Nariaki
分类号 H01L29/417;H01L29/78 主分类号 H01L29/417
代理机构 代理人
主权项 1. A semiconductor device, comprising: a p-type semiconductor layer; an n-type semiconductor layer connected with the p-type semiconductor layer; a first electrode layer formed on the n-type semiconductor layer; and a second electrode layer formed on the p-type semiconductor layer, wherein the first electrode layer and the second electrode layer are electrically connected such as to each operate at an identical potential, and the first electrode layer is connected with a connection line which is a part of a peripheral line of a joint interface between the p-type semiconductor layer and the n-type semiconductor layer on an interface side between the second electrode layer and the p-type semiconductor layer, with a surface of the p-type semiconductor layer and with at least a part of a surface of the second electrode layer which is opposite to a surface of the second electrode layer that is in contact with the p-type semiconductor layer.
地址 Kiyosu-shi JP