ABNORMAL CLOCK RATE DETECTION IN IMAGING SENSOR ARRAYS

摘要

Techniques are provided to detect abnormal clock rates in devices such as imaging sensor devices (e.g., infrared or visible light imaging devices). In one example, a device may include a clock rate detection circuit that may be readily integrated as part of the device to provide effective detection of an abnormal clock rate. The device may include a ramp generator, a counter, and/or other components. The ramp generator may generate a ramp signal independent of a clock signal provided to the device, while the counter may increment/decrement a count value in response to the clock signal. The device may include a comparator adapted to select the current count value of the counter when the ramp signal reaches a reference signal. A processor of the device may be adapted to determine whether the clock signal is operating in an acceptable frequency range, based on the selected count value.