发明名称 |
ELECTROSTATIC DISCHARGE RESISTANT DIODES |
摘要 |
A diode and a method for an electrostatic discharge resistant diode. The method includes, for example, receiving a wafer. The wafer includes a silicon layer electrically isolated from a silicon substrate by a buried oxide (BOX) layer. The BOX layer is in physical contact with the silicon layer and the silicon substrate. An N-type well is implanted in the silicon substrate. Furthermore, a vertical column of P+ doped epitaxial silicon and a vertical column of N+ doped epitaxial silicon are formed over the N-type well and extend through the BOX layer and the silicon layer. Both vertical columns may form electrical junctions with the N-type well. |
申请公布号 |
US2014167202(A1) |
申请公布日期 |
2014.06.19 |
申请号 |
US201213714404 |
申请日期 |
2012.12.14 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Bu Huiming;Gauthier, JR. Robert J.;Hook Terence B.;Leobandung Effendi;Yamashita Tenko |
分类号 |
H01L29/66;H01L29/861 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method for forming an electrostatic discharge resistant diode, the method comprising:
receiving a wafer, the wafer including a silicon layer electrically isolated from a silicon substrate by a buried oxide (BOX) layer, the BOX layer being in physical contact with the silicon layer and the silicon substrate; implanting an N-type well in the silicon substrate; forming a first vertical column of P+ doped epitaxial silicon over the N-type well and extending through the BOX layer and the silicon layer; and forming a second vertical column of N+ doped epitaxial silicon over the N-type well and extending through the BOX layer and the silicon layer.
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地址 |
Armonk NY US |