发明名称 GaN HEMTs AND GaN DIODES
摘要 A GaN hetereojunction structure has a three-layer dielectric structure. The lowermost and middle portions of the gate electrode together define the gate foot, and this is associated with two dielectric layers. A thinner first dielectric layer is adjacent the gate edge at the bottom of the gate electrode. The second dielectric layer corresponds to the layer in the conventional structure, and it is level with the main portion of the gate foot.
申请公布号 US2014167064(A1) 申请公布日期 2014.06.19
申请号 US201314108042 申请日期 2013.12.16
申请人 NXP B.V. 发明人 Hurkx Godefridus Adrianus Maria;Croon Jeroen Antoon;Donkers Johannes Josephus Theodorus Marinus;Heil Stephan;Sonsky Jan
分类号 H01L29/47;H01L29/872;H01L29/778;H01L29/40 主分类号 H01L29/47
代理机构 代理人
主权项 1. A GaN hetereojunction semiconductor device comprising: a substrate; a layer structure having a first layer having a first bandgap and a second layer having a second bandgap, wherein the first layer is located between the substrate and the second layer; and a Schottky gate electrode and a first further electrode each conductively coupled to a different area of the heterojunction, said Schottky gate electrode comprising a central region and an edge region, wherein the Schottky gate electrode comprises: a lowermost portion which is co-planar with a first dielectric layer portion over the second layer; a middle portion which is co-planar with a second dielectric layer, the middle portion overlapping the lowermost portion; and an upper portion which is co-planar with a third dielectric layer, the upper portion overlapping the middle portion.
地址 Eindhoven NL