SEMICONDUCTOR TEST DEVICE, SEMICONDUCTOR TEST METHOD AND SEMICONDUCTOR TEST SYSTEM
摘要
The present invention relates to a semiconductor test method comprising a step of generating a test input signal including test information; a step of obtaining a test output signal with regard to the test input signal; and a step of determining whether a glitch is generated based on the test information and the test output signal.
申请公布号
KR20140074681(A)
申请公布日期
2014.06.18
申请号
KR20120142921
申请日期
2012.12.10
申请人
SAMSUNG ELECTRO-MECHANICS CO., LTD.
发明人
LEE, KWANG MOOK;KIM, JIN;LEE, JAE HYUNG;MIN, SANG HYUN;CHO, KOON SHIK