| 摘要 |
Provided is an inspecting apparatus for inspecting a photovoltaic devices by applying a current to the photovoltaic devices in a forward direction to make the photovoltaic devices emit EL light which is simple in structure and capable of shortening inspection time in inspecting a defect from a photographed image with a perfect resolution. The inspecting apparatus of the present invention includes a darkroom (110) provided with an upper surface (111) having an opening portion (112), a support means provided at the upper surface of the darkroom (110) to support the photovoltaic devices as an inspecting object (200) on the opening portion (112), a plurality of cameras (121, 122 and 123) disposed inside the darkroom (110) for photographing the inspecting object (200), and a moving means configured to move the cameras in the darkroom (110). The moving means includes an x-axial guiding portion (140), a motor (142) and a timing belt (144). |
