发明名称 Semiconductor integrated circuit and abnormal oscillation detection method for semiconductor integrated circuit
摘要 A semiconductor device includes a first oscillator that generates a first clock signal, a second oscillator that generates a second clock signal in response to the first clock signal, a third oscillator that generates a third clock signal, a counter that counts a signal corresponding to the first clock signal or a signal corresponding to the second clock signal during a predetermined period that is set based on the third clock signal to generate an overflow signal indicating that a count value of the signal corresponding to the first clock signal or the signal corresponding to the second clock signal exceeds a predetermined value, and an abnormality notice unit that receives the overflow signal to generate an abnormal signal indicating that an abnormal oscillation occurs in at least one of the first to third clock signals.
申请公布号 US8754715(B2) 申请公布日期 2014.06.17
申请号 US201213551501 申请日期 2012.07.17
申请人 Renesas Electronics Corporation 发明人 Honda Masanori
分类号 G06F1/04 主分类号 G06F1/04
代理机构 McGinn IP Law Group, PLLC 代理人 McGinn IP Law Group, PLLC
主权项 1. A semiconductor device comprising: a first oscillator that generates a first clock signal; a second oscillator that generates a second clock signal in response to the first clock signal; a third oscillator that generates a third clock signal; a counter that counts a signal corresponding to the first clock signal or a signal corresponding to the second clock signal during a predetermined period that is set based on the third clock signal to generate an overflow signal indicating that a count value of the signal corresponding to the first clock signal or the signal corresponding to the second clock signal exceeds a predetermined value; and an abnormality notice unit that receives the overflow signal to generate an abnormality signal indicating that an abnormal oscillation occurs in at least one of the first to third clock signals.
地址 Kawasaki, Kanagawa JP