发明名称 |
Margining decoding utilizing soft-inputs |
摘要 |
Determining a parameter associated with whether a portion of a storage device is defective is disclosed. Determining comprises: obtaining known data associated with the portion; reading back from the portion to produce a read-back waveform; decoding the read-back waveform, including producing statistical information; and determining a parameter associated with whether the portion is defective based at least in part on the statistical information. |
申请公布号 |
US8755135(B1) |
申请公布日期 |
2014.06.17 |
申请号 |
US201113040544 |
申请日期 |
2011.03.04 |
申请人 |
SK hynix memory solutions inc. |
发明人 |
Marrow Marcus;Bellorado Jason;Kou Yu |
分类号 |
G11B27/36;H03M13/00 |
主分类号 |
G11B27/36 |
代理机构 |
Van Pelt, Yi & James LLP |
代理人 |
Van Pelt, Yi & James LLP |
主权项 |
1. A method for processing a portion of a storage device, comprising:
obtaining known data associated with the portion; reading back from the portion to produce a read-back waveform; using a detector to decode the read-back waveform, including by producing statistical information which includes (1) a set of one or more estimated values associated with the portion and (2) a set of one or more reliabilities, wherein each reliability in the set of reliabilities indicates a reliability with which a corresponding estimated value in the set of estimated values is generated; determining which of the set of estimated values are incorrect based at least in part on the set of estimated values and the known data; and counting the number of incorrect estimated values which have a corresponding reliability which is greater than a reliability threshold, including by:
determining a number of incorrect log-likelihood ratios (LLRs) that have a magnitude greater than a first threshold; andcomparing the number of incorrect LLRs that have a magnitude greater than the first threshold against a second threshold.
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地址 |
San Jose CA US |