发明名称 TRANSISTOR
摘要 <p>A thin film transistor including an oxide semiconductor with favorable electrical characteristics is provided. The thin film transistor includes a gate electrode provided over a substrate, a gate insulating film provided over the gate electrode, an oxide semiconductor film provided over the gate electrode and on the gate insulating film, a metal oxide film provided on the oxide semiconductor film, and a metal film provided on the metal oxide film. The oxide semiconductor film is in contact with the metal oxide film, and includes a region whose concentration of metal is higher than that of any other region in the oxide semiconductor film (a high metal concentration region). In the high metal concentration region, the metal contained in the oxide semiconductor film may be present as a crystal grain or a microcrystal.</p>
申请公布号 KR20140074404(A) 申请公布日期 2014.06.17
申请号 KR20147014982 申请日期 2010.10.26
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 MIYANAGA AKIHARU;SAKATA JUNICHIRO;SAKAKURA MASAYUKI;TAKAHASHI MASAHIRO;KISHIDA HIDEYUKI;YAMAZAKI SHUNPEI
分类号 H01L29/786;H01L21/336 主分类号 H01L29/786
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