| 发明名称 | Fault detection based on diagnostic history | ||
| 摘要 | Systems and methods for detecting faults in a system. The method comprising maintaining diagnostic history for one or more system components; receiving system information about operational state and relational interaction among system components; determining if one or more system components are to be examined, in response to performing an analysis of the diagnostic history, wherein the analysis is performed to determine if the diagnostic history includes any information that may indicate that certain system components or combinations of components are suspected of causing a problem detected in the system, wherein the diagnostic history is maintained based on an at least one examination performed on said one or more components when said one or more components were installed in a system other than the system in which the problem is detected. | ||
| 申请公布号 | US8756459(B2) | 申请公布日期 | 2014.06.17 |
| 申请号 | US201113285011 | 申请日期 | 2011.10.31 |
| 申请人 | International Business Machines Corporation | 发明人 | Raz-Pelleg Orna;Zlotnick Aviad |
| 分类号 | G06F11/00 | 主分类号 | G06F11/00 |
| 代理机构 | Century IP Group | 代理人 | Far-hadion, Esq Jason F.;Century IP Group |
| 主权项 | 1. A method executed on one or more processors for detecting faults in a system, the method comprising: maintaining diagnostic history for one or more system components; receiving system information about operational state and relational interaction among system components; determining if one or more system components are to be examined, in response to performing an analysis of the diagnostic history, wherein the analysis is performed to determine if the diagnostic history includes any information that may indicate that certain system components or combinations of components are suspected of causing a problem detected in the system, wherein the diagnostic history is maintained based on an at least one examination performed on said one or more components when said one or more components were installed in a system other than the system in which the problem is detected; and wherein the other system includes a test system at a vendor's location, wherein said vendor manufactures, distributes or is otherwise concerned about the proper functionality of said one or more system components in combination with each other. | ||
| 地址 | Armonk NY US | ||