发明名称 Three-dimensional semiconductor memory devices
摘要 Three-dimensional (3D) semiconductor memory devices are provided. According to the 3D semiconductor memory device, a gate structure includes gate patterns and insulating patterns alternately stacked on a semiconductor substrate. A vertical active pattern penetrates the gate structure. A gate dielectric layer is disposed between a sidewall of the vertical active pattern and each of the gate patterns. A semiconductor pattern is disposed on the gate structure and is connected to the vertical active pattern. A string drain region is formed in a portion of the semiconductor pattern and is spaced apart from the vertical active pattern.
申请公布号 US8754466(B2) 申请公布日期 2014.06.17
申请号 US201213652998 申请日期 2012.10.16
申请人 Samsung Electronics Co., Ltd. 发明人 Yun Janggn;Seol Kwang Soo;Choi Jungdal
分类号 H01L29/792 主分类号 H01L29/792
代理机构 F. Chau & Associates, LLC 代理人 F. Chau & Associates, LLC
主权项 1. A three-dimensional (3D) semiconductor memory device comprising: a gate structure including gate patterns and insulating patterns alternately stacked on a semiconductor substrate; a vertical active pattern penetrating the gate structure; a gate dielectric layer disposed between a sidewall of the vertical active pattern and each of the gate patterns; a semiconductor pattern disposed on the gate structure, the semiconductor pattern connected to the vertical active pattern; and a string drain region formed in a portion of the semiconductor pattern, the string drain region spaced apart from the vertical active pattern.
地址 Suwon-Si, Gyeonggi-Do KR