发明名称 |
Three-dimensional semiconductor memory devices |
摘要 |
Three-dimensional (3D) semiconductor memory devices are provided. According to the 3D semiconductor memory device, a gate structure includes gate patterns and insulating patterns alternately stacked on a semiconductor substrate. A vertical active pattern penetrates the gate structure. A gate dielectric layer is disposed between a sidewall of the vertical active pattern and each of the gate patterns. A semiconductor pattern is disposed on the gate structure and is connected to the vertical active pattern. A string drain region is formed in a portion of the semiconductor pattern and is spaced apart from the vertical active pattern. |
申请公布号 |
US8754466(B2) |
申请公布日期 |
2014.06.17 |
申请号 |
US201213652998 |
申请日期 |
2012.10.16 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Yun Janggn;Seol Kwang Soo;Choi Jungdal |
分类号 |
H01L29/792 |
主分类号 |
H01L29/792 |
代理机构 |
F. Chau & Associates, LLC |
代理人 |
F. Chau & Associates, LLC |
主权项 |
1. A three-dimensional (3D) semiconductor memory device comprising:
a gate structure including gate patterns and insulating patterns alternately stacked on a semiconductor substrate; a vertical active pattern penetrating the gate structure; a gate dielectric layer disposed between a sidewall of the vertical active pattern and each of the gate patterns; a semiconductor pattern disposed on the gate structure, the semiconductor pattern connected to the vertical active pattern; and a string drain region formed in a portion of the semiconductor pattern, the string drain region spaced apart from the vertical active pattern.
|
地址 |
Suwon-Si, Gyeonggi-Do KR |