Test apparatus for digital modulated signal

摘要

An amplitude expected value data generator generates amplitude expected value data that represents, in increments of sampling points, which of multiple amplitude segments the amplitude of a modulated signal waveform that corresponds to the expected value of data to be output from a device under test belongs to. A demodulator performs sampling of the signal waveform to be tested received from the device under test, and generates judgment data that represents, in increments of sampling points, which of the multiple amplitude segments the amplitude of the signal waveform belongs to. A judgment unit makes a comparison between the amplitude expected value data and the judgment data in increments of sampling points.

主权项

1. A test apparatus configured to test a digital modulated signal output from a device under test,
the test apparatus comprising: an amplitude expected value data generator configured to generate amplitude expected value data in each symbol period, wherein the amplitude expected value data defines windows that correspond to an expected symbol, and the windows represent, in increments of sampling points in the symbol period, which of a plurality of amplitude segments the amplitude of a digital modulated signal waveform that corresponds to the expected symbol should belong to; a demodulator configured to perform sampling of a waveform of the digital modulated signal output from the device under test and to generate judgment data that represents, in increments of sampling points, which of the plurality of amplitude segments the amplitude of the digital modulated signal waveform output from the device under test belongs to; and a judgment unit configured to make a comparison between the amplitude expected value data and the judgment data in increments of sampling points, to judge whether or not the waveform of the digital modulated signal from the device under test corresponds to the expected symbol.