Method of measuring surface structure of display device

摘要

A method of measuring a surface structure of a display device is provided. The display device includes first and second substrates, first and second patterned light-shielding layers, and first and second pixel units. The first patterned light-shielding layer disposed on a surface of the first substrate includes first openings. The second patterned light-shielding layer disposed on the surface of the first substrate includes second openings. The first pixel unit includes first and second protrusions. The first protrusion correspondingly covers the first openings and a portion of the first patterned light-shielding layer. The second protrusion is disposed on and directly contacted with the first and second patterned light-shielding layers. The second pixel unit includes a third protrusion correspondingly covering the second openings and a portion of the second patterned light-shielding layer, wherein sizes of the second openings are smaller than sizes of the first openings.

主权项

1. A method of measuring a surface structure of a display device, comprising:
providing a display device, the display device comprising:
a first substrate, having a first surface;a first patterned light-shielding layer, having a plurality of first openings and disposed on the first surface of the first substrate;at least one second patterned light-shielding layer, having a plurality of second openings and disposed on the first surface of the first substrate;at least one first pixel unit, comprising:
at least one first protrusion, correspondingly covering the first openings of the first patterned light-shielding layer; andat least one second protrusion, disposed on and directly contacted with the first patterned light-shielding layer and the second patterned light-shielding layer;at least one second pixel unit, comprising:
at least one third protrusion, correspondingly covering the second openings of the second patterned light-shielding layer, wherein sizes of the second openings of the second patterned light-shielding layer are smaller than sizes of the first openings of the first patterned light-shielding layer, and a length in between two of the adjacent first openings of the first bar-shaped light-shielding pattern is smaller than a length in between two of the adjacent second openings of the second bar-shaped light-shielding pattern; anda second substrate, having a second surface and disposed opposite to the first surface of the first substrate; providing a measuring apparatus; measuring a first height of the first protrusion covering a surface of the second patterned light-shielding layer, the first height being a height difference between the second patterned light-shielding layer and the first protrusion; measuring a second height of the second protrusion covering a surface of the second patterned light-shielding layer, the second height being a height difference between the second patterned light-shielding layer and the second protrusion; and calculating a third height which is a difference between the first height and the second height.