发明名称 |
3-dimensional non-volatile memory device including a selection gate having an L shape |
摘要 |
A 3-dimensional (3-D) non-volatile memory device includes a first channel protruding from a substrate, a selection gate formed on sidewalls of the first channel and in an L shape, and a gate insulating layer interposed between the first channel and the selection gate and surrounding the first channel. A method of manufacturing a 3-D non-volatile memory device includes forming first channels protruding from a substrate, forming a first gate insulating layer surrounding the first channels, and forming first selection gates having an L shape on sidewalls of the first channels on which the first gate insulating layers are formed. |
申请公布号 |
US8754485(B2) |
申请公布日期 |
2014.06.17 |
申请号 |
US201213477632 |
申请日期 |
2012.05.22 |
申请人 |
SK Hynix Inc. |
发明人 |
Lee Ki Hong;Pyi Seung Ho;Shin Sung Chul |
分类号 |
H01L21/70 |
主分类号 |
H01L21/70 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A 3-dimensional (3-D) non-volatile memory device, comprising:
a channel protruding from a substrate; a selection gate formed on sidewall of the channel and having an L shape; and a gate insulating layer interposed between the channel and the selection gate and surrounding the channel; and the selection gate includes a first region surrounding a side wall of the first channel and a second region protruding from the first region.
|
地址 |
Gyeonggi-do KR |