发明名称 3-dimensional non-volatile memory device including a selection gate having an L shape
摘要 A 3-dimensional (3-D) non-volatile memory device includes a first channel protruding from a substrate, a selection gate formed on sidewalls of the first channel and in an L shape, and a gate insulating layer interposed between the first channel and the selection gate and surrounding the first channel. A method of manufacturing a 3-D non-volatile memory device includes forming first channels protruding from a substrate, forming a first gate insulating layer surrounding the first channels, and forming first selection gates having an L shape on sidewalls of the first channels on which the first gate insulating layers are formed.
申请公布号 US8754485(B2) 申请公布日期 2014.06.17
申请号 US201213477632 申请日期 2012.05.22
申请人 SK Hynix Inc. 发明人 Lee Ki Hong;Pyi Seung Ho;Shin Sung Chul
分类号 H01L21/70 主分类号 H01L21/70
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A 3-dimensional (3-D) non-volatile memory device, comprising: a channel protruding from a substrate; a selection gate formed on sidewall of the channel and having an L shape; and a gate insulating layer interposed between the channel and the selection gate and surrounding the channel; and the selection gate includes a first region surrounding a side wall of the first channel and a second region protruding from the first region.
地址 Gyeonggi-do KR