发明名称 Manufacturing method of power transistor device with super junction
摘要 The present invention provides a manufacturing method of a power transistor device. First, a semiconductor substrate of a first conductivity type is provided, and at least one trench is formed in the semiconductor substrate. Next, the trench is filled with a dopant source layer, and a first thermal drive-in process is performed to form two doped diffusion regions of a second conductivity type in the semiconductor substrate, wherein the doping concentration of each doped diffusion region close to the trench is different from the one of each doped diffusion region far from the trench. Then, the dopant source layer is removed and a tilt-angle ion implantation process and a second thermal drive-in process are performed to adjust the doping concentration of each doped diffusion region close to the trench.
申请公布号 US8753937(B2) 申请公布日期 2014.06.17
申请号 US201213553806 申请日期 2012.07.19
申请人 Anpec Electronics Corporation 发明人 Lin Yung-Fa;Hsu Shou-Yi;Wu Meng-Wei;Chang Chia-Hao
分类号 H01L21/8236 主分类号 H01L21/8236
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A manufacturing method of a power transistor device with a super junction, comprising: providing a semiconductor substrate of a first conductivity type; forming at least one trench in said semiconductor substrate; filling a dopant source layer into said trench, wherein said dopant source layer comprises a plurality of dopants of a second conductivity type different from said first conductivity type; performing a first thermal drive-in process to diffuse said dopants into said semiconductor substrate, so as to form two doped diffusion regions in said semiconductor substrate at both sides of said trench, wherein the doping concentration of each said doped diffusion region close to the sidewall of said trench is different from the doping concentration of each said doped diffusion region far from the sidewall of said trench; removing said dopant source layer; and performing a tilt-angle ion implantation process and a second thermal drive-in process to adjust the doping concentration of each said doped diffusion region close to the sidewall of said trench.
地址 Hsinchu Science Park, Hsin-Chu TW