| 发明名称 |
SYSTEM AND METHOD FOR INSPECTION OF STRUCTURES |
| 摘要 |
Systems and methods of the invention relate to identifying a structure and a corresponding inspection for a portion of the structure and managing an appointment to perform the inspection with one or more inspectors. An evaluate component can analyze a set of inspection rules (e.g., user-defined, regulation-defined, defined by a type of structure, among others) for one or more structures, wherein a manager component can select one or more inspectors to perform the inspection. |
| 申请公布号 |
US2014164039(A1) |
申请公布日期 |
2014.06.12 |
| 申请号 |
US201314075064 |
申请日期 |
2013.11.08 |
| 申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
MITTI AARON RICHARD;ZAMBRANO CHRISTIAN;JACOBS LANCE DEREK;PAGET MARTIN |
| 分类号 |
G06Q10/06 |
主分类号 |
G06Q10/06 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method, comprising:
identifying a structure and an inspection to perform on at least a portion of the structure that is associated with an inspection date; evaluating at least one of an availability of one or more inspectors to perform the inspection on the portion of the structure no later than the inspection date or a qualification of the one or more inspectors, wherein the one or more inspectors are scheduled to perform the inspection on the portion of the structure at a scheduled date based on at least one of the availability or the qualification; and aggregating inspection data related to a result of the inspection on the portion of the structure.
|
| 地址 |
Schenectady NY US |
