发明名称 METHOD FOR PRODUCING SEMICONDUCTOR DEVICE
摘要 In the present invention, an insulating film (2) is formed on the primary surface of a semiconductor substrate (1) having an active region and a termination region. An aperture (3) is formed by etching the insulating film (2) on the active region. A diffusion layer (7) is formed at the active region by using the insulating film (2) as a mask, and injecting an impurity to the semiconductor substrate (1) from a direction inclined at least 20° from the direction normal to the primary surface of the semiconductor substrate (1) while rotating the semiconductor substrate (1). The diffusion layer (7) extends below the insulating film (2) at the termination region side of the aperture (3).
申请公布号 WO2014087543(A1) 申请公布日期 2014.06.12
申请号 WO2012JP81833 申请日期 2012.12.07
申请人 MITSUBISHI ELECTRIC CORPORATION;MASUOKA, FUMIHITO;NAKAMURA, KATSUMI;KACHI, TAKAO 发明人 MASUOKA, FUMIHITO;NAKAMURA, KATSUMI;KACHI, TAKAO
分类号 H01L29/861;H01L21/265;H01L29/06;H01L29/868 主分类号 H01L29/861
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