发明名称 |
METHOD FOR PRODUCING SEMICONDUCTOR DEVICE |
摘要 |
In the present invention, an insulating film (2) is formed on the primary surface of a semiconductor substrate (1) having an active region and a termination region. An aperture (3) is formed by etching the insulating film (2) on the active region. A diffusion layer (7) is formed at the active region by using the insulating film (2) as a mask, and injecting an impurity to the semiconductor substrate (1) from a direction inclined at least 20° from the direction normal to the primary surface of the semiconductor substrate (1) while rotating the semiconductor substrate (1). The diffusion layer (7) extends below the insulating film (2) at the termination region side of the aperture (3). |
申请公布号 |
WO2014087543(A1) |
申请公布日期 |
2014.06.12 |
申请号 |
WO2012JP81833 |
申请日期 |
2012.12.07 |
申请人 |
MITSUBISHI ELECTRIC CORPORATION;MASUOKA, FUMIHITO;NAKAMURA, KATSUMI;KACHI, TAKAO |
发明人 |
MASUOKA, FUMIHITO;NAKAMURA, KATSUMI;KACHI, TAKAO |
分类号 |
H01L29/861;H01L21/265;H01L29/06;H01L29/868 |
主分类号 |
H01L29/861 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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