PRODUCT IMAGE INSPECTION DEVICE AND PRODUCT IMAGE INSPECTION METHOD

摘要

PROBLEM TO BE SOLVED: To enable easy tuning of an inspection parameter, to reduce user workload.SOLUTION: A product image inspection device 200 includes: an image acquisition part 21 which accumulates an image of a product 1 to be inspected in an image storage part 41; an inspection parameter setting/changing part 32 which sets/changes an inspection parameter value; an expected determination data storage part 46 which accumulates information on the presence of a known defect of the product 1 in an expected value determination data storage part 46; an image inspection processing part 23 which applies predetermined image processing on the image of the product 1 read from the image storage part 41, to acquire characteristics data; a defect determination part 24 which compares the characteristics data with the inspection parameter to determine a defect of the product 1, and accumulates a determination result in an inspection determination data storage part 44; and a statistical processing part 34 which compares inspection determination data and expected determination data having the same inspection parameter and read from the inspection determination data storage part 44 and the expected determination data storage part 46, to calculate a matching rate (detection rate).