发明名称 |
pBIST ENGINE WITH REDUCED SRAM TESTING BUS WIDTH |
摘要 |
A programmable Built In Self Test (pBIST) system used to test embedded memories where the memories under test are incorporated in a plurality of sub chips not integrated with the pBIST module. Test data comparison is performed in a distributed data logging architecture to minimize the number of interconnections between the distributed data loggers and the pBIST. |
申请公布号 |
US2014164856(A1) |
申请公布日期 |
2014.06.12 |
申请号 |
US201213709247 |
申请日期 |
2012.12.10 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
Damodaran Raguram;Bhoria Naveen;Kokrady Aman |
分类号 |
G11C29/12 |
主分类号 |
G11C29/12 |
代理机构 |
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代理人 |
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主权项 |
1. An embedded memory test system comprising of:
a programmable Built In Self Test (pBIST) engine; a plurality of distributed data logging circuits communicating with the pBIST engine; a bus expander operable with each distributed data logger; and one or more memory block operable with each distributed data logger.
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地址 |
Dallas TX US |