发明名称 pBIST ENGINE WITH REDUCED SRAM TESTING BUS WIDTH
摘要 A programmable Built In Self Test (pBIST) system used to test embedded memories where the memories under test are incorporated in a plurality of sub chips not integrated with the pBIST module. Test data comparison is performed in a distributed data logging architecture to minimize the number of interconnections between the distributed data loggers and the pBIST.
申请公布号 US2014164856(A1) 申请公布日期 2014.06.12
申请号 US201213709247 申请日期 2012.12.10
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 Damodaran Raguram;Bhoria Naveen;Kokrady Aman
分类号 G11C29/12 主分类号 G11C29/12
代理机构 代理人
主权项 1. An embedded memory test system comprising of: a programmable Built In Self Test (pBIST) engine; a plurality of distributed data logging circuits communicating with the pBIST engine; a bus expander operable with each distributed data logger; and one or more memory block operable with each distributed data logger.
地址 Dallas TX US