发明名称 MAKING AND USING CARBON NANOTUBE PROBES
摘要 <p>Columns comprising a plurality of vertically aligned carbon nanotubes can be configured as electromechanical contact structures or probes. The columns can be grown on a sacrificial substrate and transferred to a product substrate, or the columns can be grown on the product substrate. The columns can be treated to enhance mechanical properties such as stiffness, electrical properties such as electrical conductivity, and/or physical contact characteristics. The columns can be mechanically tuned to have predetermined spring properties. The columns can be used as electromechanical probes, for example, to contact and test electronic devices such as semiconductor dies, and the columns can make unique marks on terminals of the electronic devices.</p>
申请公布号 KR101406270(B1) 申请公布日期 2014.06.12
申请号 KR20097010007 申请日期 2007.10.15
申请人 发明人
分类号 B82B1/00;F16F1/36;H01L21/66 主分类号 B82B1/00
代理机构 代理人
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