发明名称 METHOD FOR DETERMINING GEOMETRIC IMAGING CHARACTERISTIC OF FLAT PANEL DETECTOR, SUITABLY ADAPTED X-RAY INSPECTION SYSTEM, AND CALIBRATION PHANTOM
摘要 PROBLEM TO BE SOLVED: To provide a method for determining geometric imaging characteristics of a flat panel detector for an x-ray inspection system.SOLUTION: A method for determining geometric imaging characteristics of a flat panel detector includes the steps of: arranging a calibration phantom 13 with at least one discrete geometric body between an x-ray source 11 and the flat panel detector 12; recording at least one x-ray image of the calibration phantom 13 by the flat panel detector 12, at least one discrete geometric shape being generated in an x-ray image by imaging the at least one discrete geometric body of the calibration phantom 13; and determining a place-dependent distortion error of the flat panel detector 12 from at least one x-ray image on the basis of at least one feature of the at least one discrete geometric shape. All features of the at least one discrete geometric shape used to determine the place-dependent distortion error are unrelated to the size of the calibration phantom 13.
申请公布号 JP2014109575(A) 申请公布日期 2014.06.12
申请号 JP20130245539 申请日期 2013.11.28
申请人 GE SENSING & INSPECTION TECHNOLOGIES GMBH 发明人 ALEXANDER SUPPES;PAVEL POKUTNEV;EBERHARD NEUSER;NILS ROTHE
分类号 G01N23/04;G01T1/17;G01T7/00 主分类号 G01N23/04
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