发明名称 Low OFF-State Leakage Current Field Effect Transistors
摘要 A method is presented to decrease the OFF-state leakage current of the Field Effect Transistors (FETs). The presented method comprises of the placement of dopants underneath or anywhere adjacent to the channel which causes an increase in the band barrier at the source edge of the semiconductor of gate region at the OFF state, providing for less leakage current. Compared with the conventional method of increasing the channel doping to decrease the OFF state leakage current and achieve more scalability, a lower channel doping concentration is needed to achieve the same OFF state leakage current. This provides for less impurity scattering and higher mobility which results in larger ON state currents, higher yields and faster devices.
申请公布号 US2014159205(A1) 申请公布日期 2014.06.12
申请号 US201213709214 申请日期 2012.12.10
申请人 Rezanezhad Gatabi Iman 发明人 Rezanezhad Gatabi Iman
分类号 H01L29/06 主分类号 H01L29/06
代理机构 代理人
主权项 1- A method of decreasing the OFF state leakage current of Field Effect Transistors (FETs) with doped channels, said method comprising of incorporation of a semiconductor layer with the same doping type as the channel semiconductor and a doping concentration higher than the channel doping; wherein the higher doped layer that can have different geometrical shapes is incorporated underneath or anywhere adjacent to the channel.
地址 Bryan TX US