发明名称 MEASUREMENT MICROSCOPE DEVICE, IMAGE GENERATION METHOD, MEASUREMENT MICROSCOPE DEVICE OPERATION PROGRAM AND COMPUTER READABLE RECORDING MEDIUM
摘要 PROBLEM TO BE SOLVED: To enable an image of a wide field of view to be captured without reducing measurement accuracy.SOLUTION: A measurement microscope device comprises: a stage for mounting an object thereon; display means for displaying a height image or an observation image; measurement means for performing a measurement to the height image displayed on the display means; image connection means that acquires a plurality of height images intended for a connection and a plurality of observation images intended for the connection by moving the stage and photographing a different area including a margin for connection, interconnects the acquired plurality of height images intended for the connection and the acquired plurality of observation images intended for the connection and can generate a connection image; measurement abnormality area display means that can overlap and display a measurement abnormality area in which a measurement result in height is abnormal on an image of an object corresponding to each area to be connected by the image connection means; and measurement image photographing condition setting means for adjusting a photographing condition of a fringe image required for generation of the height image so as to reduce the measurement abnormality area with the measurement abnormality area displayed.
申请公布号 JP2014109492(A) 申请公布日期 2014.06.12
申请号 JP20120263871 申请日期 2012.11.30
申请人 KEYENCE CORP 发明人 TAKAHASHI SHINYA
分类号 G01B11/25;G01B9/04;G01B11/24;G02B21/00;H04N5/225 主分类号 G01B11/25
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