发明名称 CLEANING DEVICE
摘要 PROBLEM TO BE SOLVED: To enable scrub cleaning to be performed on a cleaned surface of a wafer in a spinner table and prevent rear surface contamination caused by contaminants coming around to a rear surface of the wafer.SOLUTION: An outer periphery holding means 20 comprises: a liquid reservoir part 21 which stores a liquid on an upper surface 21a and forms a liquid layer 6; a liquid supply port 22 which supplies the liquid to the upper surface 21a of the liquid reservoir part 21; and a lifting part 23 which selectively positions the liquid reservoir part 21 between an action position P1 and a non action position P2. Thus, when the wafer W is cleaned, the liquid reservoir part 21 is positioned at the action position P1, and an upper surface 7 of the liquid layer 6 formed at the liquid reservoir part 21 is located at a level equivalent to an upper surface 3 of the spinner table 2. Then, the liquid layer 6 holds an outer peripheral part Wc of the wafer W, and a surface Wa of the wafer W is cleaned by cleaning means 10. Further, a rear surface Wb of the wafer W is sealed by the liquid layer 6. The structure prevents contaminants from coming around to the rear surface Wb and reduces rear surface contamination of the wafer W.
申请公布号 JP2014110270(A) 申请公布日期 2014.06.12
申请号 JP20120262734 申请日期 2012.11.30
申请人 DISCO ABRASIVE SYST LTD 发明人 MIZOMOTO YASUTAKA
分类号 H01L21/304 主分类号 H01L21/304
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