发明名称 Non-volatile semiconductor memory device with dummy cells and method for adjusting threshold voltage of dummy cells
摘要 A nonvolatile semiconductor memory device and a method for controlling a threshold voltage of dummy cells are provided to minimize a read error due to read disturbance by programming the dummy cells quickly. A memory cell array(1) has dummy cells inside a cell string. The dummy cells have different threshold voltage. A sense amplifier and latch(2) senses and stores the input output data of the memory cell transistors inside the memory cell array. A column decoder(3) selects the bit lines. A low decoder(5) selects the word lines. A high voltage generating circuit(8) generates the voltage higher than the operation power voltage. A control circuit(7) controls the operation of the nonvolatile semiconductor memory device. A dummy cell controller(101) is connected to the control circuit. The dummy cell controller controls the threshold voltage of the dummy cells inside the memory cell array.
申请公布号 KR101405405(B1) 申请公布日期 2014.06.12
申请号 KR20080006431 申请日期 2008.01.22
申请人 发明人
分类号 G11C16/34 主分类号 G11C16/34
代理机构 代理人
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